Gencoa Newsletter 20 December 2013 |
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In our final newsletter of 2013, we have our fifth technical focus, which details the recently launched FFE75, a 3-inch circular full face erosion. We hope that many recipients have found the documents to be of benefit, and there will be many more to come throughout 2014. |
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FFE75: Defect reduction in thin films via plasma scanning
The use of 'clean' target sputtering offers many benefits for layer creation. For the last 30 years of PVD coating in the semiconductor industry large area clean targets are key to create high uniformity and reduce defects on the devices. Coating defects are generated from several sources related to the sputter target area:
Aimed at the small-scale research and development machines, Gencoa have launched a product that creates this clean target sputtering for 3-inch and 4-inch diameter targets. Even for such a small target magnetron source, the target use can be increased by utilizing a rotating plasma. |
Gencoa FFE75 Target use of a 3" copper target |
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Gencoa FFE75
A full version of this paper is available on the Technical Papers section of the Gencoa website, or by clicking the following link: Gencoa technical paper, December 2013. For further product information, email sales@gencoa.com. |
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Constant innovation, customer satisfaction, process support, in-depth understanding, industry experts. Simply better solutions. Gencoa.
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